ME 428 Scanning Electron Microscopy for Materials and Device Characterization

The study of the design concepts and applications of scanning electron microscopy (SEM) and spectroscopy. Topics include electron optical principles, specimen preparation, and SEM imaging and interpretation. The spectroscopy of microanalysis covers qualitative and quantitative chemical analysis of materials. The lectures and lab sessions are integrated to enhance students? learning experience.



Slash Listed Courses

Also offered for graduate-level credit as ME 528 and may be taken only once for credit.


One year of general engineering or physics or instructor approval.


ME 428L