ME 579 Material Surface Analysis: The Principal Techniques and Applications
Surface analysis techniques essential for understanding material properties and reactivities are explored, including AFM, STM, XPS, XRD, Raman Spectroscopy, SIMS, and AES. The focus is on their principles and applications to analyze physical topography, chemical composition, atomic structure, electronic states, and molecular bonding. Students will gain the skills to select appropriate techniques for surface characterization and effectively interpret results by the end of the course.
Slash Listed Courses
Also offered for graduate-level credit as
ME 679 and may be taken only once for credit.
Prerequisite
Upper-division or graduate standing with 12 engineering or physical science credits