ECE 575 Introduction to Integrated Circuit Test
Course will cover the traditional role of IC test in parametric and functional testing and the changing role of IC testing in semiconductor design and manufacturing. The course is divided into three parts. The first part reviews integrated circuit technologies and fault modeling. The second introduces digital IC test, DC parametric testing, and functional and structural testing. The third part examines technology trends.
Slash Listed Courses
Also offered as
ECE 675 and may be taken only once for credit.